Journal :   Asian Journal of Research in Chemistry

Volume No. :   3

Issue No. :  3

Year :  2010

Pages :   566-570

ISSN Print :  0974-4169

ISSN Online :  0974-4150


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Monitoring the Deposition of Copper Selenide Thin Films by Double Exposure Holographic Interferometry



Address:   V.P. Malekar and V.J. Fulari*
Holography and Materials Research Lab., Department of Physics, Shivaji University, Kolhapur, Maharashtra 416004, India
*Corresponding Author
DOI No:

ABSTRACT:
Double Exposure Holographic Interferometry (DEHI) is one of the most important applications of Holographic Interferometry. The reported technique, double exposure holographic interferometry used together with simple mathematical interpretation, which allow immediate finding of stress, mass, fringe width and thickness of thin film. It must be further noted that, fringe spacing changes with time of deposition as well as solution concentration. We have tested the samples for different normalities of solutions. The structural study was carried out by XRD for the conformation of material.
KEYWORDS:
DEHI; Exposure; Stress; Fringe Width; Thin Film.
Cite:
V.P. Malekar, V.J. Fulari. Monitoring the Deposition of Copper Selenide Thin Films by Double Exposure Holographic Interferometry. Asian J. Research Chem. 3(3): July- Sept. 2010; Page 566-570.
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