Journal :   Asian Journal of Research in Chemistry

Volume No. :   3

Issue No. :  4

Year :  2010

Pages :   950-954

ISSN Print :  0974-4169

ISSN Online :  0974-4150


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Monitoring the Cadmium Sulfide Thin Films by Double-Exposure Holographic Interferometry Technique



Address:   S.A. Gangawane*, S.D. Kamat, V.P. Malekar and V.J. Fulari
Holography and Materials Research Laboratory, Dept. of Physics, Shivaji University, Kolhapur-416 004, India
*Corresponding Author
DOI No:

ABSTRACT:
Here, the Double Exposure Holographic Interferometry (DEHI) technique is used to study the surface deformation on stainless steel substrate, when CdS is deposited on it. In the electrodeposition method at different concentrations, CdSO4 is used as cadmium source, while Na2S2O3 is used as a sulphur source and ethylene diamine tetra acetic acid (EDTA) is used as a complexing agent. The electro deposition of CdS thin films is carried out by varying the time of deposition. The deposition potential of the compound was studied by cyclic voltammetry. The structural, surface morphological and optical properties of the deposited films have been studied using X-ray diffraction (XRD), scanning electron microscope (SEM) and optical absorption technique respectively. The DEHI technique is used to determine, thickness of thin film and stress to substrate of electrodeposited CdS thin films for various deposition time and at various concentrations.
KEYWORDS:
DEHI technique; Thin Films; Electrodeposition; CdS; XRD; SEM.
Cite:
S.A. Gangawane, S.D. Kamat, V.P. Malekar, V.J. Fulari. Monitoring the Cadmium Sulfide Thin Films by Double-Exposure Holographic Interferometry Technique. Asian J. Research Chem. 3(4): Oct. - Dec. 2010; Page 950-954.
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