Journal :   Asian Journal of Research in Chemistry

Volume No. :   5

Issue No. :  2

Year :  2012

Pages :   291-294

ISSN Print :  0974-4169

ISSN Online :  0974-4150


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Temperature-dependent surface topography analysis of SnSe thin films using atomic force microscopy



Address:   Anuar Kassim1*, Tan Wee Tee1, Ho Soon Min1 and Saravanan Nagalingam2
1Department of Chemistry, Faculty of Science, Universiti Putra Malaysia, 43400 Serdang, Selangor, Malaysia.
2Faculty of Science, Universiti Tunku Abdul Rahman, 31900 Kampar, Perak, Malaysia
*Corresponding Author
DOI No:

ABSTRACT:
Tin selenide thin films have been prepared by a simple and highly reproducible chemical bath deposition method. The effect of various bath temperatures was study. The surface topography of the films has been analysed by means of the atomic force microscopy. We have observed a very strong dependence of the surface roughness, film thickness and grain size on the growth temperature. Smaller grain size, thinner and smoother films could be observed for the films deposited at lower bath temperature.
KEYWORDS:
Tin selenide; Thin films; Chemical bath deposition; Atomic force microscopy.
Cite:
Anuar Kassim, Tan Wee Tee, Ho Soon Min, Saravanan Nagalingam. Temperature-dependent surface topography analysis of SnSe thin films using atomic force microscopy. Asian J. Research Chem. 5(2): February 2012; Page 291-294.
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