Author(s):
Anuar Kassim, Tan Wee Tee, Ho Soon Min, Saravanan Nagalingam
Email(s):
soonminho@yahoo.com
DOI:
Not Available
Address:
Anuar Kassim1*, Tan Wee Tee1, Ho Soon Min1 and Saravanan Nagalingam2
1Department of Chemistry, Faculty of Science, Universiti Putra Malaysia, 43400 Serdang, Selangor, Malaysia.
2Faculty of Science, Universiti Tunku Abdul Rahman, 31900 Kampar, Perak, Malaysia
*Corresponding Author
Published In:
Volume - 5,
Issue - 2,
Year - 2012
Cite this article:
Anuar Kassim, Tan Wee Tee, Ho Soon Min, Saravanan Nagalingam. Temperature-dependent surface topography analysis of SnSe thin films using atomic force microscopy. Asian J. Research Chem. 5(2): February 2012; Page 291-294.