ISSN

0974-4150 (Online)
0974-4169 (Print)


Author(s): Anuar Kassim, Tan Wee Tee, Ho Soon Min, Saravanan Nagalingam

Email(s): soonminho@yahoo.com

DOI: Not Available

Address: Anuar Kassim1*, Tan Wee Tee1, Ho Soon Min1 and Saravanan Nagalingam2
1Department of Chemistry, Faculty of Science, Universiti Putra Malaysia, 43400 Serdang, Selangor, Malaysia.
2Faculty of Science, Universiti Tunku Abdul Rahman, 31900 Kampar, Perak, Malaysia
*Corresponding Author

Published In:   Volume - 5,      Issue - 2,     Year - 2012


Cite this article:
Anuar Kassim, Tan Wee Tee, Ho Soon Min, Saravanan Nagalingam. Temperature-dependent surface topography analysis of SnSe thin films using atomic force microscopy. Asian J. Research Chem. 5(2): February 2012; Page 291-294.




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DOI: 10.5958/0974-4150 

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