ISSN

0974-4150 (Online)
0974-4169 (Print)


Author(s): V.P. Malekar, V.J. Fulari

Email(s): Vpyash07@gmail.com

DOI: Not Available

Address: V.P. Malekar and V.J. Fulari*
Holography and Materials Research Lab., Department of Physics, Shivaji University, Kolhapur, Maharashtra 416004, India
*Corresponding Author

Published In:   Volume - 3,      Issue - 3,     Year - 2010


ABSTRACT:
Double Exposure Holographic Interferometry (DEHI) is one of the most important applications of Holographic Interferometry. The reported technique, double exposure holographic interferometry used together with simple mathematical interpretation, which allow immediate finding of stress, mass, fringe width and thickness of thin film. It must be further noted that, fringe spacing changes with time of deposition as well as solution concentration. We have tested the samples for different normalities of solutions. The structural study was carried out by XRD for the conformation of material.


Cite this article:
V.P. Malekar, V.J. Fulari. Monitoring the Deposition of Copper Selenide Thin Films by Double Exposure Holographic Interferometry. Asian J. Research Chem. 3(3): July- Sept. 2010; Page 566-570.


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